SN74ABT8646DL

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Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

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Active

Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

Technical Specifications

Parameters and characteristics for this part

Specification	SN74ABT8646DL

Logic Type	Scan Test Device with Bus Transceiver and Registers
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	28-BSSOP
Package / Case [custom]	7.5 mm
Package / Case [custom]	0.295 in
Supplier Device Package	28-BSSOP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Package / Case	Logic Type	Supply Voltage [Min]	Supply Voltage [Max]	Number of Bits	Mounting Type	Package / Case [x]	Package / Case [y]
Texas Instruments SN74ABT8646DL	85 °C	-40 °C	28-BSSOP	7.5 mm	0.295 in	28-BSSOP	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount
Texas Instruments SN74ABT8646DWRG4	85 °C	-40 °C	28-SOIC			28-SOIC	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount	0.295 in	7.5 mm
Texas Instruments SN74ABT8646DLR	85 °C	-40 °C	28-BSSOP	7.5 mm	0.295 in	28-BSSOP	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount
Texas Instruments SN74ABT8646DWR	85 °C	-40 °C	28-SOIC			28-SOIC	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount	0.295 in	7.5 mm

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General part information

Scan Test Device with Bus Transceiver and Registers IC 28-BSSOP

Technical documentation and resources

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