SN74ABT8646DWR

Obsolete

Texas Instruments

IC SCAN TEST DEVICE 28-SOIC

Search across all available documentation for this part.

Obsolete

Texas Instruments

IC SCAN TEST DEVICE 28-SOIC

Technical Specifications

Parameters and characteristics for this part

Specification	SN74ABT8646DWR

Logic Type	Scan Test Device with Bus Transceiver and Registers
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	28-SOIC
Package / Case [x]	0.295 in
Package / Case [y]	7.5 mm
Supplier Device Package	28-SOIC
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Operating Temperature [Max]	Operating Temperature [Min]	Supplier Device Package	Package / Case [custom]	Package / Case [custom]	Package / Case	Logic Type	Supply Voltage [Min]	Supply Voltage [Max]	Number of Bits	Mounting Type	Package / Case [x]	Package / Case [y]
Texas Instruments SN74ABT8646DL	85 °C	-40 °C	28-BSSOP	7.5 mm	0.295 in	28-BSSOP	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount
Texas Instruments SN74ABT8646DWRG4	85 °C	-40 °C	28-SOIC			28-SOIC	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount	0.295 in	7.5 mm
Texas Instruments SN74ABT8646DLR	85 °C	-40 °C	28-BSSOP	7.5 mm	0.295 in	28-BSSOP	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount
Texas Instruments SN74ABT8646DWR	85 °C	-40 °C	28-SOIC			28-SOIC	Scan Test Device with Bus Transceiver and Registers	4.5 V	5.5 V	8	Surface Mount	0.295 in	7.5 mm

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

General part information

Scan Test Device with Bus Transceiver and Registers IC 28-SOIC

Technical documentation and resources

No documents available