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IC SCAN-TEST-DEV/XCVR 28-SSOP
| Part | Operating Temperature [Max] | Operating Temperature [Min] | Supplier Device Package | Package / Case [custom] | Package / Case [custom] | Package / Case | Logic Type | Supply Voltage [Min] | Supply Voltage [Max] | Number of Bits | Mounting Type | Package / Case [x] | Package / Case [y] |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | 85 °C | -40 °C | 28-BSSOP | 7.5 mm | 0.295 in | 28-BSSOP | Scan Test Device with Bus Transceiver and Registers | 4.5 V | 5.5 V | 8 | Surface Mount | ||
Texas Instruments | 85 °C | -40 °C | 28-SOIC | 28-SOIC | Scan Test Device with Bus Transceiver and Registers | 4.5 V | 5.5 V | 8 | Surface Mount | 0.295 in | 7.5 mm | ||
Texas Instruments | 85 °C | -40 °C | 28-BSSOP | 7.5 mm | 0.295 in | 28-BSSOP | Scan Test Device with Bus Transceiver and Registers | 4.5 V | 5.5 V | 8 | Surface Mount | ||
Texas Instruments | 85 °C | -40 °C | 28-SOIC | 28-SOIC | Scan Test Device with Bus Transceiver and Registers | 4.5 V | 5.5 V | 8 | Surface Mount | 0.295 in | 7.5 mm |