SN74BCT8240ADWR

Obsolete

Texas Instruments

IC SCAN TEST DEVICE BUFF 24-SOIC

Search across all available documentation for this part.

Obsolete

Texas Instruments

IC SCAN TEST DEVICE BUFF 24-SOIC

Technical Specifications

Parameters and characteristics for this part

Specification	SN74BCT8240ADWR

Logic Type	Scan Test Device with Inverting Buffers
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	70 °C
Operating Temperature [Min]	0 °C
Package / Case	24-SOIC
Package / Case [custom]	7.5 mm
Package / Case [custom]	0.295 in
Supplier Device Package	24-SOIC
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Operating Temperature [Max]	Mounting Type	Number of Bits	Supply Voltage [Min]	Supply Voltage [Max]	Supplier Device Package	Package / Case [custom]	Package / Case	Package / Case [custom]	Logic Type	Package / Case	Package / Case
Texas Instruments SN74BCT8240ADWR	70 °C	Surface Mount	8	4.5 V	5.5 V	24-SOIC	7.5 mm	24-SOIC	0.295 in	Scan Test Device with Inverting Buffers
Texas Instruments SN74BCT8240ADWRG4	70 °C	Surface Mount	8	4.5 V	5.5 V	24-SOIC	7.5 mm	24-SOIC	0.295 in	Scan Test Device with Inverting Buffers
Texas Instruments SN74BCT8240ANT	70 °C	Through Hole	8	4.5 V	5.5 V	24-PDIP		24-DIP		Scan Test Device with Inverting Buffers	0.3 in	7.62 mm

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

General part information

Scan Test Device with Inverting Buffers IC 24-SOIC

Technical documentation and resources