SN74BCT8240ANT

Obsolete

Texas Instruments

IC SCAN TEST DEVICE BUFF 24-DIP

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Obsolete

Texas Instruments

IC SCAN TEST DEVICE BUFF 24-DIP

Technical Specifications

Parameters and characteristics for this part

Specification	SN74BCT8240ANT

Logic Type	Scan Test Device with Inverting Buffers
Mounting Type	Through Hole
Number of Bits	8
Operating Temperature [Max]	70 °C
Operating Temperature [Min]	0 °C
Package / Case	0.3 in
Package / Case	24-DIP
Package / Case	7.62 mm
Supplier Device Package	24-PDIP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Operating Temperature [Max]	Mounting Type	Number of Bits	Supply Voltage [Min]	Supply Voltage [Max]	Supplier Device Package	Package / Case [custom]	Package / Case	Package / Case [custom]	Logic Type	Package / Case	Package / Case
Texas Instruments SN74BCT8240ADWR	70 °C	Surface Mount	8	4.5 V	5.5 V	24-SOIC	7.5 mm	24-SOIC	0.295 in	Scan Test Device with Inverting Buffers
Texas Instruments SN74BCT8240ADWRG4	70 °C	Surface Mount	8	4.5 V	5.5 V	24-SOIC	7.5 mm	24-SOIC	0.295 in	Scan Test Device with Inverting Buffers
Texas Instruments SN74BCT8240ANT	70 °C	Through Hole	8	4.5 V	5.5 V	24-PDIP		24-DIP		Scan Test Device with Inverting Buffers	0.3 in	7.62 mm

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

General part information

Scan Test Device with Inverting Buffers IC 24-PDIP

Technical documentation and resources