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IC SCAN TEST DEVICE BUFF 24-SOIC
| Part | Operating Temperature [Max] | Operating Temperature [Min] | Mounting Type | Number of Bits | Supply Voltage [Min] | Supply Voltage [Max] | Supplier Device Package | Package / Case [custom] | Package / Case | Package / Case [custom] | Logic Type | Package / Case | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | 70 °C | 0 °C | Surface Mount | 8 | 4.5 V | 5.5 V | 24-SOIC | 7.5 mm | 24-SOIC | 0.295 in | Scan Test Device with Inverting Buffers | ||
Texas Instruments | 70 °C | 0 °C | Surface Mount | 8 | 4.5 V | 5.5 V | 24-SOIC | 7.5 mm | 24-SOIC | 0.295 in | Scan Test Device with Inverting Buffers | ||
Texas Instruments | 70 °C | 0 °C | Through Hole | 8 | 4.5 V | 5.5 V | 24-PDIP | 24-DIP | Scan Test Device with Inverting Buffers | 0.3 in | 7.62 mm |