SN74BCT8373ANT

Obsolete

Texas Instruments

IC SCAN TEST DEVICE LATCH 24-DIP

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Obsolete

Texas Instruments

IC SCAN TEST DEVICE LATCH 24-DIP

Technical Specifications

Parameters and characteristics for this part

Specification	SN74BCT8373ANT

Logic Type	Scan Test Device with D-Type Latches
Mounting Type	Through Hole
Number of Bits	8
Operating Temperature [Max]	70 °C
Operating Temperature [Min]	0 °C
Package / Case	0.3 in
Package / Case	24-DIP
Package / Case	7.62 mm
Supplier Device Package	24-PDIP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Number of Bits	Logic Type	Supplier Device Package	Operating Temperature [Max]	Operating Temperature [Min]	Package / Case [custom]	Package / Case	Package / Case [custom]	Supply Voltage [Min]	Supply Voltage [Max]	Mounting Type	Package / Case	Package / Case
Texas Instruments SN74BCT8373ADWR	8	Scan Test Device with D-Type Latches	24-SOIC	70 °C	0 °C	7.5 mm	24-SOIC	0.295 in	4.5 V	5.5 V	Surface Mount
Texas Instruments SN74BCT8373ADWRG4	8	Scan Test Device with D-Type Latches	24-SOIC	70 °C	0 °C	7.5 mm	24-SOIC	0.295 in	4.5 V	5.5 V	Surface Mount
Texas Instruments SN74BCT8373ANT	8	Scan Test Device with D-Type Latches	24-PDIP	70 °C	0 °C		24-DIP		4.5 V	5.5 V	Through Hole	0.3 in	7.62 mm
Texas Instruments SN74BCT8373DWR
Texas Instruments SN74BCT8373DW

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

General part information

Scan Test Device with D-Type Latches IC 24-PDIP

Technical documentation and resources