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IC SCAN TEST DEVICE LATCH 24SOIC
| Part | Number of Bits | Logic Type | Supplier Device Package | Operating Temperature [Max] | Operating Temperature [Min] | Package / Case [custom] | Package / Case | Package / Case [custom] | Supply Voltage [Min] | Supply Voltage [Max] | Mounting Type | Package / Case | Package / Case |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | 8 | Scan Test Device with D-Type Latches | 24-SOIC | 70 °C | 0 °C | 7.5 mm | 24-SOIC | 0.295 in | 4.5 V | 5.5 V | Surface Mount | ||
Texas Instruments | 8 | Scan Test Device with D-Type Latches | 24-SOIC | 70 °C | 0 °C | 7.5 mm | 24-SOIC | 0.295 in | 4.5 V | 5.5 V | Surface Mount | ||
Texas Instruments | 8 | Scan Test Device with D-Type Latches | 24-PDIP | 70 °C | 0 °C | 24-DIP | 4.5 V | 5.5 V | Through Hole | 0.3 in | 7.62 mm | ||
Texas Instruments | |||||||||||||
Texas Instruments |