TOP050I064/200G

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Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

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Chip Shine / CSRF

ICT SPRING CONTACT TEST PROBE

Technical Specifications

Parameters and characteristics for this part

Specification	TOP050I064/200G

Current Rating (Amps)	3 A
Length - Overall [x]	43.15 mm
Length - Overall [x]	1.7 in
Length - Tip	0.272 "
Length - Tip	6.9 mm
Material - Body	Phosphor Copper, Gold Plated
Material - Tip	Beryllium Copper, Steel, Gold Plated
Tip Type	Spring Tip - Serrated Head
Tip Type [diameter]	0.025 in
Tip Type [diameter]	0.64 mm

Part	Length - Tip	Length - Tip	Current Rating (Amps)	Material - Tip	Length - Overall [x]	Length - Overall [x]	Tip Type [diameter]	Tip Type	Tip Type [diameter]	Material - Body	Tip Type [diameter]
Chip Shine / CSRF TOP050H05/200G	0.272 "	6.9 mm	3 A	Beryllium Copper Gold Plated Steel	43.15 mm	1.7 in	0.5 mm	Spring Tip - Crown Head	0.02 in	Phosphor Copper Gold Plated
Chip Shine / CSRF TOP050I064/200G	0.272 "	6.9 mm	3 A	Beryllium Copper Gold Plated Steel	43.15 mm	1.7 in		Spring Tip - Serrated Head	0.64 mm	Phosphor Copper Gold Plated	0.025 in
Chip Shine / CSRF TOP050I05/200G	0.272 "	6.9 mm	3 A	Beryllium Copper Gold Plated Steel	43.15 mm	1.7 in	0.5 mm	Spring Tip - Serrated Head	0.02 in	Phosphor Copper Gold Plated
Chip Shine / CSRF TOP050A05/100G	0.272 "	6.9 mm	3 A	Beryllium Copper Gold Plated Steel	43.15 mm	1.7 in		Spring Tip - Pyramid Head	0.5 mm	Phosphor Copper Gold Plated	0.02 in

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

Distributor	Package	Quantity	$

General part information

3 A Spring Tip - Serrated Head, 0.025" (0.64mm) Dia

Technical documentation and resources