ICT SPRING CONTACT TEST PROBE
| Part | Length - Tip | Length - Tip | Current Rating (Amps) | Material - Tip | Length - Overall [x] | Length - Overall [x] | Tip Type [diameter] | Tip Type | Tip Type [diameter] | Material - Body | Tip Type [diameter] |
|---|---|---|---|---|---|---|---|---|---|---|---|
Chip Shine / CSRF | 0.272 " | 6.9 mm | 3 A | Beryllium Copper Gold Plated Steel | 43.15 mm | 1.7 in | 0.5 mm | Spring Tip - Crown Head | 0.02 in | Phosphor Copper Gold Plated | |
Chip Shine / CSRF | 0.272 " | 6.9 mm | 3 A | Beryllium Copper Gold Plated Steel | 43.15 mm | 1.7 in | Spring Tip - Serrated Head | 0.64 mm | Phosphor Copper Gold Plated | 0.025 in | |
Chip Shine / CSRF | 0.272 " | 6.9 mm | 3 A | Beryllium Copper Gold Plated Steel | 43.15 mm | 1.7 in | 0.5 mm | Spring Tip - Serrated Head | 0.02 in | Phosphor Copper Gold Plated | |
Chip Shine / CSRF | 0.272 " | 6.9 mm | 3 A | Beryllium Copper Gold Plated Steel | 43.15 mm | 1.7 in | Spring Tip - Pyramid Head | 0.5 mm | Phosphor Copper Gold Plated | 0.02 in |