SN74ABT8952DL

Obsolete

Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

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Obsolete

Texas Instruments

IC SCAN-TEST-DEV/XCVR 28-SSOP

Technical Specifications

Parameters and characteristics for this part

Specification	SN74ABT8952DL

Logic Type	Scan Test Device with Registered Bus Transceiver
Mounting Type	Surface Mount
Number of Bits	8
Operating Temperature [Max]	85 °C
Operating Temperature [Min]	-40 °C
Package / Case	28-BSSOP
Package / Case [custom]	7.5 mm
Package / Case [custom]	0.295 in
Supplier Device Package	28-BSSOP
Supply Voltage [Max]	5.5 V
Supply Voltage [Min]	4.5 V

Part	Supply Voltage [Min]	Supply Voltage [Max]	Number of Bits	Mounting Type	Logic Type	Supplier Device Package	Package / Case	Package / Case [x]	Package / Case [y]	Operating Temperature [Max]	Operating Temperature [Min]	Package / Case [custom]	Package / Case [custom]
Texas Instruments SN74ABT8952DWR	4.5 V	5.5 V	8	Surface Mount	Scan Test Device with Registered Bus Transceiver	28-SOIC	28-SOIC	0.295 in	7.5 mm	85 °C	-40 °C
Texas Instruments SN74ABT8952DL	4.5 V	5.5 V	8	Surface Mount	Scan Test Device with Registered Bus Transceiver	28-BSSOP	28-BSSOP			85 °C	-40 °C	7.5 mm	0.295 in
Texas Instruments SN74ABT8952DW	4.5 V	5.5 V	8	Surface Mount	Scan Test Device with Registered Bus Transceiver	28-SOIC	28-SOIC	0.295 in	7.5 mm	85 °C	-40 °C

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

General part information

Scan Test Device with Registered Bus Transceiver IC 28-BSSOP

Technical documentation and resources