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IC SCAN TEST DEVICE 28SOIC
| Part | Supply Voltage [Min] | Supply Voltage [Max] | Number of Bits | Mounting Type | Logic Type | Supplier Device Package | Package / Case | Package / Case [x] | Package / Case [y] | Operating Temperature [Max] | Operating Temperature [Min] | Package / Case [custom] | Package / Case [custom] |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
Texas Instruments | 4.5 V | 5.5 V | 8 | Surface Mount | Scan Test Device with Registered Bus Transceiver | 28-SOIC | 28-SOIC | 0.295 in | 7.5 mm | 85 °C | -40 °C | ||
Texas Instruments | 4.5 V | 5.5 V | 8 | Surface Mount | Scan Test Device with Registered Bus Transceiver | 28-BSSOP | 28-BSSOP | 85 °C | -40 °C | 7.5 mm | 0.295 in | ||
Texas Instruments | 4.5 V | 5.5 V | 8 | Surface Mount | Scan Test Device with Registered Bus Transceiver | 28-SOIC | 28-SOIC | 0.295 in | 7.5 mm | 85 °C | -40 °C |