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5962-9323901Q3A - Texas Instruments-UC1875L PWM and Resonant Controllers Resonant Controller 500mA 1000kHz 28-Pin CLLCC Tube

5962-9323901Q3A

Active
Texas Instruments

MILITARY 4-CH, 4.5-V TO 5.5-V INVERTERS WITH TTL-COMPATIBLE CMOS INPUTS AND 3-STATE OUTPUTS

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Search across all available documentation for this part.

DocumentsLOGIC Pocket Data Book (Rev. B)Implications of Slow or Floating CMOS Inputs (Rev. E)+9
5962-9323901Q3A - Texas Instruments-UC1875L PWM and Resonant Controllers Resonant Controller 500mA 1000kHz 28-Pin CLLCC Tube

5962-9323901Q3A

Active
Texas Instruments

MILITARY 4-CH, 4.5-V TO 5.5-V INVERTERS WITH TTL-COMPATIBLE CMOS INPUTS AND 3-STATE OUTPUTS

Deep-Dive with AI

DocumentsLOGIC Pocket Data Book (Rev. B)Implications of Slow or Floating CMOS Inputs (Rev. E)+9

Technical Specifications

Parameters and characteristics for this part

Specification5962-9323901Q3A
Logic TypeSCAN-PATH LINKERS
Mounting TypeSurface Mount
Number of Bits4
Operating Temperature [Max]70 °C
Operating Temperature [Min]0 °C
Package / Case28-SOIC
Package / Case [x]0.295 in
Package / Case [y]7.5 mm
Supplier Device Package28-SOIC
Supply Voltage [Max]5.5 V
Supply Voltage [Min]4.5 V

Pricing

Prices provided here are for design reference only. For realtime values and availability, please visit the distributors directly

DistributorPackageQuantity$
DigikeyBulk 3$ 127.16
Texas InstrumentsTUBE 1$ 134.65
100$ 130.60
250$ 108.73
1000$ 101.24

Description

General part information

5962-9323901 Series

The 'ACT8997 are members of the Texas Instruments SCOPETMtestability integrated-circuit family. This family of components facilitates testing of complex circuit-board assemblies.

The 'ACT8997 enhance the scan capability of TI's SCOPETMfamily by allowing augmentation of a system's primary scan path with secondary scan paths (SSPs), which can be individually selected by the 'ACT8997 for inclusion in the primary scan path. These devices also provide buffering of test signals to reduce the need for external logic.

By loading the proper values into the instruction register and data registers, the user can select up to four SSPs to be included in a primary scan path. Any combination of the SSPs can be selected at a time. Any of the device's six data registers or the instruction register can be placed in the device's scan path, i.e., placed between test data input (TDI) and test data output (TDO) for subsequent shift and scan operations.