UCC21330-Q1 Series

Automotive, 3kVRMS 4A/6A two-channel gate driver with disable logic and programmable deadtime

Catalog

Automotive, 3kVRMS 4A/6A two-channel gate driver with disable logic and programmable deadtime

Part	Approval Agency	Number of Channels [custom]	Voltage - Output Supply [Max]	Voltage - Output Supply [Min]	Mounting Type	Grade	Voltage - Isolation	Propagation Delay tpLH / tpHL (Max) [Max] [custom]	Propagation Delay tpLH / tpHL (Max) [Max] [custom]	Pulse Width Distortion (Max) [Max]	Current - Peak Output	Current - Output High, Low	Supplier Device Package	Rise / Fall Time (Typ) [custom]	Rise / Fall Time (Typ) [custom]	Package / Case	Package / Case [x]	Package / Case [y]	Technology	Common Mode Transient Immunity (Min) [Min]	Qualification
Texas Instruments UCC21330BQDRQ1	CQC CSA UL VDE	2	5.5 V	3 V	Surface Mount	Automotive	3000 VAC	45 ns	45 ns	6 ns	4 A 6 A	4 A 6 A	16-SOIC	8 ns	8 ns	16-SOIC	0.154 in	3.9 mm	Capacitive Coupling	125 V/ns	AEC-Q100

Catalog

Automotive, 3kVRMS 4A/6A two-channel gate driver with disable logic and programmable deadtime

Key Features

• Universal: dual low-side, dual high-side or halfbridge driverAEC-Q100 qualified with the following resultsDevice temperature grade 1Junction temperature range –40 to +150°CUp to 4A peak source and 6A peak sink outputCommon-mode transient immunity (CMTI) greater than 125V/nsUp to 25V VDD output drive supply5V,8V,12V VDD UVLO optionsSwitching parameters:33ns typical propagation delay5ns maximum pulse-width distortion10µs maximum VDD power-up delayUVLO protection for all power suppliesFast disable for power sequencingUniversal: dual low-side, dual high-side or halfbridge driverAEC-Q100 qualified with the following resultsDevice temperature grade 1Junction temperature range –40 to +150°CUp to 4A peak source and 6A peak sink outputCommon-mode transient immunity (CMTI) greater than 125V/nsUp to 25V VDD output drive supply5V,8V,12V VDD UVLO optionsSwitching parameters:33ns typical propagation delay5ns maximum pulse-width distortion10µs maximum VDD power-up delayUVLO protection for all power suppliesFast disable for power sequencing

Description

The UCC21330-Q1 is an isolated dual channel gate driver family with programmable dead time and wide temperature range. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, SiC, GaN, and IGBT transistors. The UCC21330-Q1 can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. The input side is isolated from the two output drivers by a 3kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI). Protection features include: resistor programmable dead time, disable feature to shut down both outputs simultaneously, and integrated de-glitch filter that rejects input transients shorter than 5ns. All supplies have UVLO protection. With all these advanced features, the UCC21330-Q1 device enables high efficiency, high power density, and robustness in a wide variety of power applications. The UCC21330-Q1 is an isolated dual channel gate driver family with programmable dead time and wide temperature range. It is designed with 4A peak-source and 6A peak-sink current to drive power MOSFET, SiC, GaN, and IGBT transistors. The UCC21330-Q1 can be configured as two low-side drivers, two high-side drivers, or a half-bridge driver. The input side is isolated from the two output drivers by a 3kVRMS isolation barrier, with a minimum of 125V/ns common-mode transient immunity (CMTI). Protection features include: resistor programmable dead time, disable feature to shut down both outputs simultaneously, and integrated de-glitch filter that rejects input transients shorter than 5ns. All supplies have UVLO protection. With all these advanced features, the UCC21330-Q1 device enables high efficiency, high power density, and robustness in a wide variety of power applications.