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UC1843-HIREL Series

Space-grade, 30-V input, 1-A single-output 500-kHz PWM controller in DIE

Manufacturer: Texas Instruments

Catalog

Space-grade, 30-V input, 1-A single-output 500-kHz PWM controller in DIE

Key Features

Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change NotificationQualification Pedigree(1)Optimized for Off-line and DC-to-DC ConvertersLow Start Up Current (<0.5 mA)Trimmed Oscillator Discharge CurrentAutomatic Feed Forward CompensationPulse-by-Pulse Current LimitingEnhanced Load Response CharacteristicsUnder-Voltage Lockout With HysteresisDouble Pulse SuppressionHigh Current Totem Pole OutputInternally Trimmed Bandgap Reference500 kHz OperationLow RO Error Amp(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.Controlled BaselineOne Assembly/Test Site, One Fabrication SiteExtended Temperature Performance of –55°C to 125°CEnhanced Diminishing Manufacturing Sources (DMS) SupportEnhanced Product Change NotificationQualification Pedigree(1)Optimized for Off-line and DC-to-DC ConvertersLow Start Up Current (<0.5 mA)Trimmed Oscillator Discharge CurrentAutomatic Feed Forward CompensationPulse-by-Pulse Current LimitingEnhanced Load Response CharacteristicsUnder-Voltage Lockout With HysteresisDouble Pulse SuppressionHigh Current Totem Pole OutputInternally Trimmed Bandgap Reference500 kHz OperationLow RO Error Amp(1)Component qualification in accordance with JEDEC and industry standards to ensure reliable operation over an extended temperature range. This includes, but is not limited to, Highly Accelerated Stress Test (HAST) or biased 85/85, temperature cycle, autoclave or unbiased HAST, electromigration, bond intermetallic life, and mold compound life. Such qualification testing should not be viewed as justifying use of this component beyond specified performance and environmental limits.

Description

AI
The UC1843 family of control devices provides the necessary features to implement off-line or dc-to-dc fixed frequency current mode control schemes with a minimal external parts count. Internally implemented circuits include under-voltage lockout featuring start up current less than 1 mA, a precision reference trimmed for accuracy at the error amp input, logic to insure latched operation, a PWM comparator which also provides current limit control, and a totem pole output stage designed to source or sink high peak current. The output stage, suitable for driving N-Channel MOSFETs, is low in the off state. The under-voltage lockout threshold is 8.4 V and maximum duty cycle range is around 100%. The UC1843 family of control devices provides the necessary features to implement off-line or dc-to-dc fixed frequency current mode control schemes with a minimal external parts count. Internally implemented circuits include under-voltage lockout featuring start up current less than 1 mA, a precision reference trimmed for accuracy at the error amp input, logic to insure latched operation, a PWM comparator which also provides current limit control, and a totem pole output stage designed to source or sink high peak current. The output stage, suitable for driving N-Channel MOSFETs, is low in the off state. The under-voltage lockout threshold is 8.4 V and maximum duty cycle range is around 100%.